
FA Inspector (AOI) Scanner
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FocalSpot, Inc. | www.FocalSpot.com
Metal Electrode Face (MELF)
1 or 2 600
Very difficult due to the reflective properties and
inconsistency of the marking.
Enable polarity
Disable Center Alternate Templates
Disable Color Check
Quad Flat Pack (QFP)
1 or 2 600-700
Avoid the date code, train on the model number
of the chip. If it is a long label you may need to
break up the template into two or more
“Templates”.
Ball Grid Array (BGA)
+
w/ Optional
Dependency
1 or 2 600-700
Small Outline Integrated Circuit (SOIC)
1 or 2 600-700
Thin Small Outline Package (TSOP)
+
w/ Optional
Dependency
2 or 3 600-700
CAUTION: Using a magnification of 3-4 (cam# 3-4 in the CXF file) may require lower threshold score
settings. If lower than recommended scores are used ALWAYS verify the inspection routine using a bare board
to insure that settings have not been adjusted too low (which could result in false pass for these devices).
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