AOpen AOI-702U Especificaciones descargar pdf (Pagina 89)

FA Inspector (AOI) Scanner

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AOI Mode uses template-matching instead of algorithm-based analysis; which dramatically speeds up test

development and does not require programming. However, the precision of the inspection results relies heavily

on the quality of the templates selected. Therefore, the idea is to select a device inspection area with

distinctive and consistent markings.

Best Practice: It is generally recommended that you do not exceed a maximum of (10) ten templates for

each unique device. The primary reason for this is speed. More templates, the more time the system will

search for a match with in the list of templates before judging the part pass/fail and moving on to the next part.

A balance between speed and precision is preferable and bad templates should always be deleted.

1. Right-click on the device outline displayed in the Video 1 Display Screen. This will open a Device

Editor Menu. Select <Edit Alternative> to review and delete bad templates. See Template Training

Methods and Settings for more information on this topic.

Edit Alternatives… Edit Alternative Templates Example Templates

The image above is a poor template and

should be deleted because it does not

contain a right-side solder connection.

Best Practice: Higher magnification can amplify subtle differences in the device template. As a rule;

use Magnification (2) for all devices larger than 0805 and Magnification (3) for devices smaller.

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AOpen AOI-702U Especificaciones Pagina 89